Peking University Radiation Monitoring Microsystem Key Technology Project Results Accepted Acceptance

China Instrument Network Instrument Research and Development On April 23rd, the key technology research of the radiation monitoring microsystem project led by Prof. Chen Zhongjian, a national key laboratory of the School of Information Science and Technology and Micron/Nano Process Technology, was the first completed unit of Peking University. The "Applied" and Appraisal Meeting was held at the Micron Nanoelectronics Building of Peking University. The appraisal will be chaired by Liu Shuang, the patent office of the Science and Technology Development Center of the Ministry of Education.

First of all, Zhang Ming, Director of the Patent Office of the Scientific Research Department of Peking University, delivered a welcome speech on behalf of the school. Zhou Jing, deputy director of the Science and Technology Development Center of the Ministry of Education, spoke on behalf of the appraisal unit.

Chen Zhongjian made technical achievements from silicon radiation sensors, application specific integrated circuit (ASIC) chips, and radiation monitoring microsystems. The project team broke through a series of key technologies (such as low-leakage, low-noise silicon radiation sensor structure design and process technology, low-noise, low-power front-end ASIC design technology, low crosstalk, multi-function micro-system integration technology through independent innovation. Etc.) The developed sample was tested (in which the front-end ASIC chip has been supplied with more than 30,000 pieces) and was highly evaluated by users.

Hu Ransheng, a senior engineer of China National Nuclear Corporation's Beijing Nuclear Instrument Factory, made a sample and prototype test report on behalf of the test panel. Zhou Chunzhi, a researcher at the Research Institute of Chemical Protection, made a report on the application of technical results on behalf of the user unit. The experts of the appraisal committee chaired by Academician Hao Yue, the vice president of Xidian University, visited the site and sampled the prototype. They reviewed the relevant technical data, and formed the appraisal opinion after questioning and commenting. They all agreed that the technical result is difficult and the key technology Integration with the system has important innovations, and the overall technology has reached the international advanced level.

Subsequently, Zhongcan Can, vice president of the Advanced Technology Research Institute of Peking University, and academician Huang Ru, dean of the School of Information Science and Technology, expressed their gratitude to the participating experts and leaders. Some members of the project team from Fudan University and Tsinghua University also attended the appraisal meeting.

(Original title: The Academy of Information Science and Technology holds the “Project Monitoring and Application of Key Technologies for Radiation Monitoring Microsystems”